The Surface Analysis and Material Characterization Laboratory provide critical materials analysis and characterization support to facilitate research in materials science in the University, both within and outside the Institute of Advanced Materials. We also provide surface and materials analysis services to local industries such as microelectronics, paint, plastic, textile and metal finishing-electroplating. Currently, our laboratory is one of the most advanced and well-equipped laboratories for surface analysis and research in Hong Kong. Major equipment include Bruker MultiMode 8 Atomic Force Microscope (AFM), Field Emission Scanning Electron Microscope (FESEM) and Transmission Electron Microscope (TEM), both mounted with Energy Dispersive X-ray Spectrometer (EDX), X-ray Diffractometer (XRD) and a Multi-technique Surface Analysis System equipped with X-ray Photoelectron Spectrometer (XPS) / Ultraviolet Photoelectron Spectrometer (UPS).