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Surface Analysis & Material Characterization Laboratory

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Angle Dependent XPS  (ADXPS) Study of ITO

The degree of surface sensitivity of  XPS may be varied by collecting photoelectrons emitted at different take-off angles (TOA) to the surface plane. Figure 1 illustrated that the surface sensitivity was significantly enhanced using a low TOA. Hence,  ADXPS was a powerful tool for performing nondestructive surface depth profile.

Surface Sensitivity vs TOA

In this example,  Angular-dependent X-ray photoelectron spectroscopy (ADXPS) and ultraviolet photoelectron spectroscopy (UPS) were used to determine the chemical composition, the chemical states and the work function   of Indium tin oxide (ITO) surfaces after each treatment of  solvent cleaning, by plasma of oxygen, argon, nitrogen and by argon ion (Ar+) sputtering.

Figures 2 and 3 showed one of curve-fitting results for O (1s) envelope and C (1s) envelope measured at  90o take-off angle.

Curve fit result for O1s at 90 (TOA)
Figure 2   Curve-fit results of O 1s ADXPS spectra at TOA : 90o after solvent cleaning treatment.

Curve fit for 
   Carbon 1s at TOA = 90
Figure 3   Curve-fit results of C 1s ADXPS spectra at TOA: 90o after solvent cleaning treatment.

Summary of ADXPS & UPS
Table 1      Summary of Carbon Atomic Concentration, Chemistry and Work Function of ITO after Various Plasma Treatment.


It was found that oxygen plasma and nitrogen plasma chemically reacted with the ITO surfaces to reduce the hydrocarbon and C-O contamination at the surface. Yet little etching of the surface can be observed after plasma treatments. Among all treatments, oxygen-plasma-treated ITO achieved the highest work function of 4.40 eV, whereas Ar+-sputtered ITO surface had the lowest work function of 3.90 eV. The stoichiometry of the ITO surface is shown to be the major controlling factor of the ITO work function.

Click to view full details of ADXPS Study on Indium-Tin-Oxide Surfaces

Selected Publications on XPS/UPS Studies on Indium-Tin-Oxide Surface

  1. S.K. So, W.K. Choi, C.H. Cheng, L.M. Leung, C.F. Kwong, "Surface Preparation and Characterization of Indium Tin Oxide Substrates for Organic Electroluminescent Devices", Appl. Phys. A 68, 447-450 (1999).
  2. W.Song, S.K. So, L. Cao, "Angular-Dependent Photoemission Studies of Indium Tin Oxide Surfaces", Appl. Phys. A 72, 361-365 (2001).
  3. Weijie Song, S.K. So, Daoyuan Wang, Yong Qiu, Lili Cao, "Angle Dependent X-ray Photoemission Study on UV-Ozone Treatments of Indium Tin Oxide", Applied Surface Science 177 (2001) 158-164.