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Bruker D8 Advance Xray
Diffractrometer
This
RGC-funded Bruker AXS D8 Advance X-Ray
Diffractometer is located in Room 501 OEN Hall Main Building.
Bruker D8 ADVANCE XRD has the ability to
perform a full range of applications, from qualitative and quantitative
phase identification, structure refinement, catalyst and thin film
in-situ investigation under ambient or non-ambient conditions.
Specifications:
X-ray Source
Non-monochromated Cu Kα X-Ray
Line focus 0.04 x 12 mm
Point focus 0.4 x 1.2 mm
Detectors:
Point detector
LynxEye 1D detector
Optics:
Both Bragg-Brentano and Parallel Beam Geometry
Gobel Mirror
0.12° (Long Soller Slit)
Pin Holes after Goebel for Point source (0.3 / 0.5 / 1.0mm)
0.05 mm Slit for Low Angle XRD
Goniometer:
High precision microprocessor controlled, two circle goniometer with
independent stepper motors and optical encoders
ϑ/ϑ Vertical
Smallest angular step size: 0.0001°
Reproducibility : 0.0001°
Sample Stage:
Standard Stage
XYZ motorized sample stage with Vacuum Chuck
Motorizing Rotating Reflection & Transmission Sample Stage
XRK 900 Motorized Alignment Stage
High Temperature MRI stage (RT-800°C)
Software:
Leptos-R
Topas
Nanofit
ICCD PDF-2 Database Release 2009
Application
Phase Identification – Powder and Thin Film
Quantitative Phase Analysis
Structure Refinement
Microdiffraction and Mapping
Thin Film Analysis : Roughness, Thickness, Density
In-Situ Investigation for Catalysts and Thin Film
For further enquiry, please contact Mr. Benson Leung, Tel: (852)
34115876, email scleung@hkbu.edu.hk
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